Zitat
P. Schulz and C. Wolff, “Cyber Physical Test System - a novel approach in testing for the Embedded Systems Industry,” in 2019 IEEE AUTOTESTCON, 2019, pp. 1–5.
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Peter Schulz
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Cyber Physical Test System - a novel approach in testing for the Embedded Systems Industry (2019 IEEE AUTOTESTCON)
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Format
Konferenzpaper
P. Schulz and C. Wolff, “Cyber Physical Test System - a novel approach in testing for the Embedded Systems Industry,” in 2019 IEEE AUTOTESTCON, 2019, pp. 1–5.