Zitat
P. Schulz and C. Wolff, “Cyber Physical Test System - a novel approach in testing for the Embedded Systems Industry,” 2019 IEEE AUTOTESTCON. IEEE, USA, pp. 1–5, 2019.
Interne Autorenschaft
Weitere Publizierende
Peter Schulz
Veröffentlichung
Sammelband
Cyber Physical Test System - a novel approach in testing for the Embedded Systems Industry (2019 IEEE AUTOTESTCON)
Organisationseinheit
Fachgebiete
Format
Konferenzpaper
P. Schulz and C. Wolff, “Cyber Physical Test System - a novel approach in testing for the Embedded Systems Industry,” 2019 IEEE AUTOTESTCON. IEEE, USA, pp. 1–5, 2019.