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P. Schulz and C. Wolff, “Cyber Physical Test System - a novel approach in testing for the Embedded Systems Industry,” 2019 IEEE AUTOTESTCON. IEEE, USA, pp. 1–5, 2019.
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Peter Schulz
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Anthology
Cyber Physical Test System - a novel approach in testing for the Embedded Systems Industry (2019 IEEE AUTOTESTCON)
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Conference paper
P. Schulz and C. Wolff, “Cyber Physical Test System - a novel approach in testing for the Embedded Systems Industry,” 2019 IEEE AUTOTESTCON. IEEE, USA, pp. 1–5, 2019.