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Fault tolerance evaluation study of a RISC-V microprocessor for HEP applications

Journal article

Fast facts

  • Internal authorship

  • Further publishers

    M.A. Alexander Walsemann, Alexander Stanitzki, Dietmar Tutsch

  • Publishment

    • IOP Publishing 2024
  • Purpose of publication

  • Organizational unit

  • Subjects

    • Micro- and nanoelectronics
  • Research structures

    • Learning Chips Lab (LCL)
  • Research fields

    • Micro- and nanosystems

Quote

A. Walsemann, M. Karagounis, A. Stanitzki, and D. Tutsch, "Fault tolerance evaluation study of a RISC-V microprocessor for HEP applications," Journal of Instrumentation, vol. 19, pp. C02012-C02012, 2024.

References and Relationships

DOI 10.1088/1748-0221/19/02/C02012

Notes and references

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