Quote
P. Schulz, N. Sleibi, C. Wolff, and C. Hensen, "Could an open-source approach to test systems help the embedded systems industry?", in 2024 IEEE AUTOTESTCON, 2024, pp. 1-6.
References
DOI 10.1109/AUTOTESTCON47465.2024.10697501
Could an open-source approach to test systems help the embedded systems industry?
Conference paper
Fast facts
Internal authorship
Further publishers
Christian Hensen
Publishment
- 2024
Purpose of publication
Organizational unit
Subjects
- Computer science in general
Research fields
- Intelligent production